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How to Process potential defects from static analysis tool using public JIRA system


Static analysis can detect potential defects which can cause critical errors with just scanning or building the source code. The SVACE which is developed through years of joint development between Samsung Electronics and Ivannikov Institute for System Programming of the Russian Academy of Sciences (ISP RAS http://www.ispras.ru) has been adapted to Tizen platform development to prevent critical errors at the Code Review phase.